The Spots Recorded on Film During X-Ray Diffraction Analyses Are

Question

The spots recorded on film during X-ray diffraction analyses are due to
A) artifacts.
B) scattering.
C) wave interference.
D) absorption.
E) fluorescence.

Accepted Answer

The spots recorded on film during X-ray diffraction analyses are due to wave interference between X-rays and the crystals being analyzed. This produces a pattern of spots on the film that corresponds to the structural arrangement of the crystals.